PATENTS

2022

1.  Imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method,” Shunsuke Sasaki, Ichiro Suehiro, Shuhei Shibata, David Ignacio Serrano Garcia, Yukitoshi Otani, Current Assignee: Utsunomiya University and Nitto Denko Corp. Link

PEER REVIEWED JOURNALS 

2023

1. “Complex Fourier Demodulation Approach for the Dual Rotation Polarizer-Analyzer Polarimeter,” Joel Cervantes-L, Geliztle A. Parra Escamilla, Jorge Luis Flores Núñez and David I. Serrano García, Revista Mexicana de Fisica, (2023) (Accepted).

2. “Linear Retardance Model for a Rotating Polarizer-Analyzer Polarimeter,” Geliztle A Parra-Escamilla, Francisco J Cervantes-Lozano and David I Serrano-García, Asian Journal of Physics, (2023) (Accepted).

2022

3. “Measurement of the optical phase using two simultaneous interferograms with a polarized Mach–Zehnder interferometer coupled to a replicator system,” A Quiroz, David-Ignacio Serrano-García, G Reséndiz-López, A Monzalvo-Hernández, L García-Lechuga, Noel-Ivan Toto-Arellano, Optics Communications, Vol 508, pp 127685.

4. “Characterizations and Use of Recycled Optical Components for Polarizing Phase-Shifting Interferometry Applications”, Juan M Islas-Islas, Germán Reséndiz-López, José G Ortega-Mendoza, Luis García-Lechuga, Adolfo Quiroz, David-Ignacio Serrano-García, Benito Canales-Pacheco, Noel-Ivan Toto-Arellano, Photonics, Vol 9 (3), (2022).

2021

5. “Michelson interferometer for phase shifting interferometry with a liquid crystal retarder,” Yanely B Machuca-Bautista, Marija Strojnik, Jorge L Flores, David I Serrano-García, Guillermo García-Torales, Results in Optics, Vol 5, pp 100197.

6. “Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization”, Gustavo A Gómez-Méndez, Amalia Martínez-García, David I Serrano-García, Juan Antonio Rayas-Álvarez, Areli Montes Pérez, Juan M Islas-Islas, Noel Ivan Toto-Arellano, Optics Communications, Vol 498, pp 127245

2020

7. “Dynamic parallel phase-shifting electronic speckle pattern interferometer,” Noel-Ivan Toto-Arellano, Gustavo A Gómez-Méndez, Amalia Martínez-García, Yukitoshi Otani, David I Serrano-García, Juan Antonio Rayas, Gustavo Rodríguez-Zurita, Luis García-Lechuga, Applied Optics, Vol 59 (27).

8. “Single shot phase-shifting interferometry with q = ±1 optical vortices and modulation of polarization”, G Rodríguez-Zurita, AG Calderón-Hernández, LA Rendón-Delgado, NI Toto-Arellano, DI Serrano-García. Optics & Laser Technology, 2020, Vol 128, 106199.

9. “Phase stepping through polarizing modulation in electronic speckle pattern interferometry”, Gustavo A. Gómez-Méndez, Gustavo Rodríguez-Zurita, Amalia Martínez-García, Yukitoshi Otani, David I. Serrano-García, Luis García-Lechuga, and Noel Ivan Toto-Arellano. Applied Optics Vol. 59, Issue 20, pp. 6005-6011 (2020).

10.  “Pixelated polarizing system for dynamic interferometry events employing a temporal phase unwrapping approach”, Geliztle A Parra-Escamilla, David I Serrano-García, Jorge L Flores, Yukitoshi Otani. Optics Communications, 2020, Vol. 458, 124862.

11.  “Development of a dynamic interferometer using recycled components based on polarization phase shifting techniques,” JM Islas Islas, Victor H Flores-Muñoz, D-I Serrano-García, JG Ortega-Mendoza, M Durán Sánchez, A Guzmán Barraza, Noel-Ivan Toto-Arellano, Optics & Laser Technology, Vol 123, PP 105915.

2019

12.  “Dynamic Mach–Zehnder interferometer based on a Michelson configuration and a cube beam splitter system”, A. Montes Pérez, G. Rodríguez-Zurita, V. H. Flores-Muñoz, G. Parra-Escamilla, D. I. Serrano-García, A. Martínez-García, J. M. Islas-Islas, J. G. Ortega-Mendoza, L. García Lechuga, Noel-Ivan Toto-Arellano. Optical Review, 2019, Vol. 26 (2), 231-240.

2018

13.  “Temporal measurements of transparent samples with four simultaneous interferograms by using a Mach–Zehnder Interferometer,” Noel-Ivan Toto-Arellano, David I Serrano-García, Gustavo Rodríguez-Zurita, Areli Montes Pérez, Geliztle Parra-Escamilla, Optics Communications, 2018, Vol 429 pp 8087.

14.  “Multiwavelength wavefront detection based on a lateral shear interferometer and polarization phase-shifting techniques, David I Serrano-Garcia, Noel-Ivan Toto-Arellano, Geliztle-Alejandra Parra-Escamilla, Amalia Martínez García, Gustavo Rodríguez-Zurita, Yukitoshi Otani, Applied Optics, 2018, Vol. 57 (24), pp 6860-6865.

2017            

15.  “Optical path difference measurements with a two-step parallel phase shifting interferometer based on a modified Michelson configuration”, Noel Ivan Toto-Arellano; David I. Serrano-Garcia; Gustavo Rodriguez-Zurita. Optical Engineering, 2017, Vol 56 (9), 094107.

16.  “Dynamic phase measurements based on a polarization Michelson interferometer employing a pixelated polarization camera,”  David I Serrano-Garcia, Yukitoshi Otani, Advanced Optical Technologies, 2017. Vol. 6(1), pp. 47-51.

2016

17.  “Mueller-matrix modeling and characterization of a dual-crystal electro-optic modulator,” Joel Cervantes-L, David I. Serrano-Garcia, Yukitoshi Otani and Barry Cense. Optics Express, 2016, Vol. 24 (21), 24213-24224.

18.  “Enhanced intensity variation for multiple-plane phase retrieval using a spatial light modulator as a convenient tunable diffuser”, Percival F. Almoro, Quang Duc Pham, David I. Serrano-Garcia, Satoshi Hasegawa, Yoshio Hayasaki, Mitsuo Takeda, and Toyohiko Yatagai. Optics Letters, 2016, Vol. 41 (10), 2161-2164.

19.  Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms”, V. H. Flores Muñoz, N.-I. Toto Arellano, D. I. Serrano García, A. Martínez García, G. Rodríguez Zurita, and L. García Lechuga. Applied Optics, 2016, Vol 55 (15), 4047-4051.

20.  “Accuracy Enhancement of Dual Rotating Mueller Matrix Imaging Polarimeter by Diattenuation and Retardance Error Calibration Approach,” Kaustav Bhattacharyya, David I. Serrano-Garcia and Yukitoshi Otani, Optics Communications, 2016.

21.  “Dynamic Phase Measurements based on a Polarization Michelson Interferometer Employing a Pixelated Polarization Camera,” David I. Serrano-Garcia and Yukitoshi Otani, Advanced Optical Technologies, 2016.

2014

22.  “Single shot interferometry using a two-interferogram phase shifting algorithm”, D.I. Serrano-Garcia, A. Martinez Garcia, N.I. Toto-Arellano and Yukitoshi Otani. Advanced Optical Technologies, 2014, Vol. 3 (4). (No Impact Factor)

23.  “Dynamic temperature field measurements using a polarization phase shifting technique”, D.I. Serrano-Garcia, A. Martinez Garcia, N.I. Toto-Arellano and Yukitoshi Otani. Optical Engineering, 2014, Vol 53 (11). 112202.

2013

24.  “Parallel two-step phase shifting interferometry using a double cyclic shear interferometer”, NI Toto-Arellano, DI Serrano-García, A Martínez-García Optics Express, 2013 21 (26), 31983-31989.

25.  “Measurement of the dynamic phase profile of transparent fluids,” N. I. Toto Arellano, D. I. Serrano García, Amalia Martínez García, G. Rodríguez Zurita, A. Montes Pérez, J. M. Miranda Gómez, G. Resendiz López, A. González Rosas, L. García Lechuga, G. A. Parra Escamilla. Óptica Pura y Aplicada, 46(1), 21-28, 2013

2012

26.  "Radial slope measurement of dynamic transparent samples", DI Serrano-García, NI Toto-Arellano, A Martínez-García, GR Zurita, 2012, Journal of Optics 14 045706.

27.  "Adjustable-window grating interferometer based on a Mach-Zehnder configuration for phase profile measurements of transparent samples" DI Serrano-García, NI Toto-Arellano, A Martínez-García, et al. Optical Engineering, 2012, 51 (5), 055601-1-055601-7

28.  "Dynamic phase profile of phase objects based on the use of a quasi- common path interferometer", DI Serrano-García, NI Toto-Arellano, A Martínez-García, et. al, Optik, 2012, 123 (19), 1742-1745

29.  “Single shot phase shifting techniques for 4D radial slope measurements of transparent samples,” N. I. Toto-Arellano, D. I. Serrano-García, Amalia Martínez García, G. Rodríguez-Zurita, A. Montes-Pérez, J. M. Miranda-Gómez, G. Reséndiz López, A. González Rosas, and L. García-Lechuga, Revista Mexicana de Física, 58, 335–338, 2012.

2011

30.  “4D profile of phase objects through the use of a simultaneous phase shifting quasi-common path interferometer”. NI Toto-Arellano, DI Serrano-García, AM García, GR Zurita, et al 2011 Journal of Optics 14 (1), 019601.

31.  “Simultaneous phase-shifting cyclic interferometer for generation of lateral and radial shear” DI Serrano-Garcıa, NI Toto-Arellano, AM Garcıa, et al. Revista Mexicana de Fisica, 2011, 57 (3), 255-258.

BOOK CHAPTERS AND TECHNICAL HANDBOOKS

2012

-        Book title: Interferometry - Research and Applications in Science and Technology (ISBN 978-953-308-459-6).

Chapter title: Simultaneous Phase Shifting Shearing Interferometry for Measurement of Static and Dynamic Phase Objects

Authors: Noel-Ivan Toto-Arellano, David-Ignacio Serrano-García, Amalia Martínez-García and Gustavo Rodriguez-Zurita

-        Book title: Interferometry - Research and Applications in Science and Technology (ISBN 978-953-308-459-6)

Chapter title: Experimental phase-shifts observed in the Fourier spectra of phase gratings and applications in simultaneous PSI.

Authors: Noel-Ivan Toto-Arellano, Gustavo Rodriguez-Zurita, David-Ignacio Serrano-García and Graciela Hernández-Orduña

2011

-        Book Title: Teoría Física de Rejillas de Amplitud y Fase (Spanish Edition)

Authors: Noel Ivan Toto Arellano, Gustavo Rodríguez Zurita, David Ignacio Serrano García.

Publisher: Editorial Académica Española (November 5, 2011)

CONFERENCES & PRESENTATIONS

2022

1.  Deformation measurements employing electronic speckle pattern interferometry using phase-shifting modulated by polarization,” David I. Serrano, Amalia Martínez Garcia, Noel Ivan Toto Arellano and Yukitoshi Otani. The 2nd International Workshop on Optics, Biology and Related Technologies, (Virtual), Utsunomiya, Japan

2021

2.  Dynamic phase measurements employing a pixelated polarizing camera and temporal phase unwrapping algorithms,” Yanely Machuca, Geliztle A Parra-Escamilla, Noel Ivan Toto Arellano, Jorge L Flores, David I Serrano-García. Poster – Optics & Photonics SPIE Conference, San Diego, California, USA.

2020

3.  ” Calibration approach for a rotating polarizer analyzer polarimeter for retardance measurements,” Francisco J Cervantes Lozano, Geliztle A Parra-Escamilla, Héctor Santiago-Hernández, Jorge L Flores, Guillermo García-Torales, David I Serrano-García. Poster – Optics & Photonics SPIE Conference, San Diego, California, USA.

2019

4.  ”Retardance parameters measurements by employing a rotating polarizer-analyzer polarimeter,” Humberto Macias-Mendoza, David I Serrano-García, Jorge L Flores, Guillermo García Torales, Azael Mora-Núñez, Héctor Santiago Hernández, Geliztle A Parra Escamilla, Francisco J Cervantes Lozano. Poster – Optics & Photonics SPIE Conference, San Diego, California, USA.

2018

5.  ” Dynamic interferometric measurements employing a pixelated polarization sensor and FFT spatial-temporal filtering techniques,” David I. Serrano Garcia and Yukitoshi Otani. Oral – Optics & Photonics SPIE Conference, San Diego, California, USA.

6.  ” Retardance Polarization Measurement Based on a Dual Rotating Polarizer Arrangement,” David I. Serrano-García, Humberto Macías-Mendoza, Jorge L. Flores, Guillermo García-Torales, Geliztle A. Parra-Escamilla and Antonio Muñoz. Oral – Optics & Photonics SPIE Conference, San Diego, California, USA.

7.  “Interferometric measurements based on Polarization Phase Shifting Techniques employing a Pixelated Polarization Sensor”, Invitacion a Seminario. Tec de Monterrey, Campus Monterrey, Monterrey, N.L. México.

2017

8.  ”Three-dimensional movement analysis for near infrared system using stereo vision and optical flow techniques,” Geliztle A. Parra Escamilla, David Ignacio Serrano-García, Yukitoshi Otani. Oral – Optics & Photonics International Conference (OPIC 2017), Yokohama, Japan..

9.  ”Phase Sensitive CT Measurement Using a Pixelated Polarizing Shearing Interferometer,” David I. Serrano-Garcia and Yukitoshi Otani. Oral – The 24th Congress of the International Commission for Optics (ICO-24), Yokohama, Japan.

10.   “Phase sensitive CT measurement using a pixelated polarizing shearing Interferometer,” David I. Serrano-Garcia and Yukitoshi Otani, Poster – The twelfth Japan-Finland Joint Symposium on Optics in Engineering (OIE 17), Niigata, Japan.

11.   “Interferometric measurements based on Polarization Phase Shifting Techniques employing a Pixelated Polarization Sensor”, Invitacion a Seminario. Centro de Investigaciones en Optica A.C., León, Gto. Mexico.

12.   ““Interferometric measurements based on Polarization Phase Shifting Techniques employing a Pixelated Polarization Sensor”, Oral. International Conference On Applied Electronics ( ICApplE 2017), Yuriria, México.

2016

13.   “Phase Sensitive CT Measurement Using a Lateral Shear Interferometer and a Pixelated Polarizing Camera”, David I. Serrano Garcia and Yukitoshi Otani. Plenary Presentation at the International Conference on Optical and Photonic Engineering (icOPEN 2016), Chengdu, China.

14.   ”Phase Sensitive CT Measurement Using a Pixelated Polarizing Shearing Interferometer,” David I. Serrano Garcia and Yukitoshi Otani. Poster - The 2nd Biomedical Imaging and Sensing Conference (BISC’16), Tokyo, Japan.

15.   “Dual Photoelastic Modulator and Rotating wave plate based Mueller matrix polarimeter to measure the optical properties of scattering media,” Pradipta Mukherjee, David I. Serrano-Garcia and Yukitoshi Otani. Oral - The Japanese Society of Applied Physics (JSAP) – Spring Meeting, Tokyo, Japan.

16.   “Mueller matrix imaging polarimeter with non-ideal retarder calibration,” Bhattacharyya Kaustav, Yukitoshi Otani and David I. Serrano Garcia. Oral - The Japanese Society of Applied Physics (JSAP) – Spring Meeting, Tokyo, Japan.

17.   “Phase sensitive CT measurement using a pixelated polarizing shearing interferometer,” David I. Serrano-Garcia and Yukitoshi Otani. Oral - The Japanese Society of Precision Engineering (JSPE) – Spring Meeting, Tokyo, Japan.  

2015

18.   “Phase Sensitive Computer Tomographic Measurement Using a Single Shot Interferometry Technique” (A09), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – Japanese Society of Precision Engineering (JSPE) – Spring Meeting. Toyo University, Hakusan Campus. Tokyo, Japan.

19.   “Temporal phase measurements using a pixelated polarization phase shifting interferometer” (14a-A14-9), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – The 62nd Japanese Society of Applied Physics (JSAP) Spring Meeting, Shonan Campus, Tokai University, Tokyo Japan.

20.   “Phase sensitive computer tomographic measurement using a pixelated phase mask interferometry technique” (9525-9), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral - SPIE Optical Metrology - Optical Measurement Systems for Industrial Inspection IX. Munich, Germany.

21.   “Phase sensitive computer tomographic measurement using a pixelated phase mask interferometry technique” (1570203477), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – The 2nd International Conference on Opto-Electronics and Applied Optics 2015 (OPTRONIX-2015). British Columbia University, Vancouver, Canada.  

22.   “Computer tomography measurement using a pixelated polarizing interferometer” (9792-20), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – SPIE/OSJ Biophotonics Japan. University of Tsukuba, Tokyo Campus. Tokyo, Japan.

2014

23.   "Dynamic temperature field measurements using a polarization phase shifting technique", David Ignacio Serrano-García*, Amalia Martínez, Noel Ivan Toto Arellano, et al., Proceedings of SPIE Vol. 9204, 92040E (2014) Oral – SPIE Optics & Photonics, San Diego , CA.

24.   “Polarization Phase Shifting Analysis on The Pixelated Phase-Mask Dynamic Interferometer” (17p-S8-10), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – The 75th Japanese Society of Applied Physics (JSAP) Autumn Meeting, Sapporo Campus, Hokkaido University, Japan.

25.   “Dynamic temperature field measurements using a polarization phase shifting technique” (18a-E4-2), David-Ignacio Serrano-García*, Amalia Martinez, Noel-Ivan Toto-Arellano and Yukitoshi Otani. Oral – The 61st Japanese Society of Applied Physics (JSAP) Spring Meeting, Sagamihara Campus, Aoyama Gakuin University, Tokyo Japan.

26.   “3-D Surface Profilometry Employing the Polarization Phase Shifting Technique” (A34), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – The 11th IMEKO Symposyum Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI) – EPOCHAL Tsukuba, Tsukuba, Japan.

27.   “Temporal phase measurements using a polarization phase shifting interferometer” (5pE1), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral - Optics + Photonics Japan, University of Tsukuba, Tokyo Campus, Tokyo, Japan.

28.   “Temporal phase measurements using a polarization phase shifting interferometer” (4), David-Ignacio Serrano-García* and Yukitoshi Otani. Oral – 54th Lightwave Sensing Technology Research Association Conference Tokyo University of Science, Morito Memorial. Tokyo, Japan.

29.   “Dynamic temperature field measurements using a polarization phase shifting technique” (P1 D9), Amalia Martínez-García*, David I. Serrano-García, Noel-Ivan Toto-Arellano and Yukitoshi Otani. Poster – 23rd International Commission for Optics (ICO-23) Santiago de Compostela, Spain.

2013

30.   “Single Shot Phase Shifting Interferometry using a Two Interferograms Phase Shifting Algorithm”, David I. Serrano-Garcia*, Yukitoshi Otani, Amalia Martinez-Garcia and Noel-Ivan Toto-Arellano. (H04). Oral - Japanese Society of Precision Engineering (JSPE) – Fall Meeting. Kansai University, Japan.

31.   “Polarization Phase Shifting Analysis on The Pixelated Phase-Mask Dynamic Interferometer”, David Serrano*，Yukitoshi Otani, Noel-Ivan Toto-Arellano and Amalia Martinez-Garcia. (14aC8). Oral - Optics + Photonics Japan, Nara, Japan.

32.   “Single Shot Phase Shifting Interferometry Using A Two-Interferograms Phase Shifting Algorithm”, David Ignacio Serrano García*, Yukitoshi Otani, Amalia Martínez García and Noel Ivan Toto Arellano. Oral - ISOT2013 - International Symposium on Optomechatronic Technologies - Jeju Islands, South Korea.

33.   "Two step parallel phase shifting interferometry using a double cyclic shear interferometer", Noel Ivan Toto Arellano*, David Serrano Garcia, Proceedings of SPIE Vol. 8785, 87853W (2013). Poster – 8th Iberoamerican Optics Meeting and 11th Latin American Meeting on Optics, Lasers, and Applications (RIAO/OPTILAS), Porto, Portugal

34.   “Single Shot Phase Shifting Interferometry Using A Two-Interferograms Phase Shifting Algorithm”, David I. Serrano García*, Yukitoshi Otani, Amalia Martínez-García, Noel-Ivan Toto-Arellano, CIOMP-OSA Summer Session    on Optical Engineering, Design and Manufacturing (SumSession_OEDM) Tu6, Vol. , Pag.24-26 (2013). Poster - CIOMP-OSA Summer Session on Optical Engineering, Design and Manufacturing. Changchun, China.

2012

35.   “Single Shot Phase Shifting Interferometry Using A Two-Step Self-Tuning Phase Shifting Method”, David Ignacio Serrano García*, Noel Ivan Toto Arellano, Amalia Martínez García and Juan Antonio Rayas Alvarez , Optics & Photonics - Optical Engineering + Applications., No Proceeding. Poster – SPIE Optics & Photonics, San Diego, CA.

2011

36.   “Single Shot Phase Shifting Interferometry For Measurement of Transparent Samples”, David-Ignacio Serrano-García*, Noel-Ivan Toto-Arellano, Amalia Martínez-García, Gustavo Rodríguez-Zurita and Areli Montes Perez, Proc. SPIE, Dimensional Optical Metrology and Inspection for Practical Applications, Vol.8133 (2011). Poster - 22nd Congress of the International Commission for Optics, Puebla, Mexico.

37.   “Parallel Phase Shifting Interferometry Using A Double Cyclic Shear Interferometer” Noel-Ivan Toto-Arellano, David-Ignacio Serrano-García*, Amalia Martínez-García, Juan Antonio Rayas-Álvarez, Gustavo Rodríguez-Zurita, Areli Montes-Pérez, Proc. SPIE, 22nd Congress of the International Commission for Optics: Light for the Development of the World, Vol.8011. (2011). Poster - 22nd Congress of the International Commission for Optics, Puebla, Mexico.

38.   “Slope Measurement Of A Phase Object”, Noel-Ivan Toto-Arellano, Amalia Martínez-García, Juan Antonio Rayas-Álvarez, David-Ignacio Serrano-García*, Proc. SPIE 22nd Congress of the International Commission for Optics: Light for the Development of the World, Vol.8011. (2011). Poster - 22nd Congress of the International Commission for Optics, Puebla, Mexico.

39.   “Simultaneous Phase Shifting Interferometry Based on A Mach Zehnder Interferometer For Measurement Of Transparent Samples”. David-Ignacio Serrano-García*, Noel-Ivan Toto-Arellano, Amalia Martínez-García, et. al,

Proc. SPIE: 22nd Congress of the International Commission for Optics: Light for the Development of the World, Vol.8011. Poster - 22nd Congress of the International Commission for Optics, Puebla, Mexico.

40.   “Radial Slope Measurements Of Transparent Samples Using Phase Shifting Interferometry By Polarization”. David Ignacio Serrano García*, Amalia Martínez García, Noel Ivan Toto Arellano, Gustavo Rodríguez Zurita, Proc. SPIE: Eighth Symposium Optics in Industry, Vol.8287. Poster – Eighth Symposium Optics in Industry (SOI), Toluca, Mexico

2010

41.   “Topography Measurement Of Specular And Diffuse Surfaces”. David Ignacio Serrano García*, Amalia Martínez García, Juan Antonio Rayas-Alvarez, Reflection, Scattering, and Diffraction from Surfaces II, Vol.7792. Poster – SPIE Optics & Photonics, San Diego, CA.

2006

42.   “Development   and Application of Talbot Images Technique For Reconstruction of Three Dimensional Objects”, David Ignacio Serrano García*, Amalia Martínez García, Alfonso Serrano Heredia, Juan Antonio Rayas Alvarez, Interferometry XIII: Techniques and Analysis, Vol.6292. Poster – SPIE Optics & Photonics, San Diego California, USA (2006)

AWARDS & HONORS

2022

1.  Senior Member Status Granted by the Optical Society of America (OPTICA) previously known as OSA. Link

2.  Level I of the Mexican National Researchers Systems (SNI) 2022-2025

2018

3.  Level I of the Mexican National Researchers Systems (SNI) 2018-2021

2017

4.  Funding from the Mexican Science Council through the program “Repatriación CONACYT 2017” for acting as visiting researcher at Guadalajara University at engineering campus for 2018.

2015

5.  Best Paper Award at 2nd International Conference on Opto-Electronic and Applied Optics (OPTRONIX). Vancouver, Canada. 2015

6.  International Aid Travel Grant Provided by Mitutoyo Association for Science and Technology (MAST) to travel SPIE - Optical Metrology Conference. Munich, Germany.

2014

7.  International Aid Travel Grant Provided by Yazaki Foundation to travel San Diego, California. August 2014.

8.  Level I of the Mexican National Researchers Systems (SNI). 2015-2017

2013

9.  Best Presentation Award in 2013 CIOMP-OSA Summer Session. Changchun, China. 2013.

2011

10.   Scholarship granted by SPIE, the International Society for Optics and Photonics for potential contributions to the field of optics, photonics or related field. 2011

11.   Full Travel Grant to assist the 5th Canadian-American-Mexican Graduate Student Physics Conference in Washington D.C. granted by the APS. September 2011

12.   OSA Foundation travel grant to assist The Frontiers in Optics 2011 Conference in San Jose, CA. October 2011.

13.   1st Place SPIE Student Poster Presentation during the 22nd International Commission for Optics (ICO-22) held in Puebla,México. August 2011.

14.   Newport Research Excellence Award granted for SPIE in Optics & Photonics Conference in San Diego, CA. August 2006